Performance optimization of Si/Gd extreme ultraviolet multilayers
D. L. Windt, J. A. Bellotti, B. Kjornrattanawanich, and J. F. Seely, App. Opt. 48, 5502 – 5508 (2009)
Performance, structure and stability of SiC/Al multilayer films for extreme ultraviolet applications
D. L. Windt and J. A. Bellotti, App. Opt. 48, 4932 – 4941 (2009)
Normal-incidence silicon–gadolinium multilayers for imaging at 63 nm wavelength
B. Kjornrattanawanich, D. L. Windt and J. F. Seely, Opt. Lett., 33, 965 (2008)
The EUV Imaging Spectrometer for Hinode
J. L. Culhane, L. K. Harra, A. M. James, J. Al-Janabi, L. J. Bradley, R. A. Chaudry, K. Rees, J. A. Tandy, P. Thomas, M. C. R. Whillock, B. Winter, G. Doschek, C. M. Korendyke, C. M., Brown, S. Myers, J. Mariska,J. Seely, J. Lang, B. J. Kent, B. M., Shaughnessy, P. R. Young, G. M. Simnett, C. M., Castelli, S. Mahmoud, H. Mapson-Menard, B. J. Probyn, R. J. Thomas, J. Davila, K. Dere, D. Windt, J. Shea, R. Hagood, R. Moye, H. Hara, T. Watanabe, K. Matsuzaki, T. Kosugi, V. Hansteen, Ø. Wikstol, Solar Physics, 243, 19 – 61 (2007)
Reduction of stress and roughness by reactive sputtering in W/B4C multilayer films
D. L. Windt, Proc. SPIE, 6688 (2007)
Terbium-based extreme ultraviolet multilayers
D. L. Windt, J. F. Seely, B. Kjornrattanawanich, and Yu. A. Uspenskii, Opt. Lett., 30, 3186 - 3188 (2005)
Stability of EUV multilayers to long-term heating, and to energetic protons and neutrons, for extreme solar missions
A. D. Rousseau, D. L. Windt, B. Winter, L. Harra, H. Lamoureux, and F. Eriksson, Proc. SPIE, 5900 (2005)
Development and testing of EUV multilayer coatings for the Atmospheric Imaging Assembly aboard the Solar Dynamics Observatory
R. Soufli, D. L. Windt, J. C. Robinson, S. L. Baker, E. Spiller, F. J. Dollar, A. L. Aquila, E. M. Gullikson, B. Kjornrattanawanich, J. F. Seely, L. Golub, Proc. SPIE, 5901 (2005)
Experimental comparison of extreme-ultraviolet multilayers for solar physics
D. L. Windt, S. Donguy, J. Seely and B. Kjornrattanawanich, App. Opt. 43, 1835 – 1848 (2004)
Normal-incidence efficiencies of multilayer-coated laminar gratings for the Extreme-Ultraviolet Imaging Spectrometer on the Solar-B mission
J. F. Seely, C. M. Brown, D. L. Windt, S. Donguy and B. Kjornrattanawanich, App. Opt., 43, 1463 - 1471 (2004)
EUV multilayers for solar physics
D. L. Windt, S. Donguy, J. Seely, B. Kjornrattanawanich, E. M. Gullikson, C. C. Walton, L. Golub, E. DeLuca, Proc. SPIE, 5168, 1 (2003)
Optical constants for hard x-ray multilayers over the energy range E=35 - 180 keV
D. L. Windt, S. Donguy, C. J. Hailey, J. Koglin, V. Honkimaki, E. Ziegler, F. E. Christensen, F. A. Harrison, Proc. SPIE, 5168, 35 (2003)
W/SiC X-ray multilayers optimized for use above 100 keV
D. L. Windt, S. Donguy, C. J. Hailey, J. Koglin, V. Honkimaki, E. Ziegler, F. E. Christensen, C. M. H. Chen, F. A. Harrison, W. W. Craig, Proc. SPIE, 4851, 639 (2002) & App. Opt., 42, 2415 - 2421 (2003)
Microstructure of thin tantalum films sputtered onto inclined substrates: Experiments and atomistic simulations
J. Dalla Torre, G. H. Gilmer, D. L. Windt, R. Kalyanaraman, F. H. Baumann, P. L. O'Sullivan, J. Sapjeta, T. Diaz de la Rubia, and M. Djafari Rouhani, J. App. Phys., 94, 263 - 271 (2003)
Diffraction-limited astronomical X-ray imaging and X-ray interferometry using normal-incidence multilayer optics
D. L. Windt, S. M. Kahn, G. E. Sommargren, Proc. SPIE, 4851, 441 (2003)
Normal-incidence reflectance of optimized W/B4C X-ray multilayers in the range 1.4 nm < lambda < 2.4 nm
D. L. Windt, E. M. Gullikson, C. C. Walton, Opt. Lett., 27, 2212-2214 (2002)
The feasibility of detecting 'cosmological' gray dust
D. L. Windt, Ap. J. L., 564, L61 (2002)
A photometric imaging solar telescope, tunable in the extreme ultraviolet, utilizing multilayer X-ray optics
L. Golub, E. DeLuca, P. Hamilton, G. Nystrom, D. L. Windt, W. K. H. Schmidt and A. Dannenberg, Rev. Sci. Instr., 73, 1908 (2002)
Growth, structure and performance of depth-graded W/Si multilayers for hard X-ray optics
D. L. Windt , F. E. Christensen, W. W. Craig, C. Hailey, F. A. Harrison, M. Jimenez-Garate, R. Kalyanaraman, and P. H. Mao, J. Appl. Phys., 88, 460 (2000)
X-ray multilayer coatings for use at energies above 100 keV
D. L. Windt , F. E. Christensen, W. W. Craig, C. Hailey, F. A. Harrison, M. Jimenez-Garate, R. Kalyanaraman, and P. H. Mao, Proc. SPIE, 4012, 442 (2000)
Stress, microstructure and stability of Mo/Si, W/Si, and Mo/C multilayer films
D. L. Windt , J. Vac. Sci. Technol. A, 18, 980-991 (2000)
The scattering of X-rays by interstellar dust on the micro-arcsecond scale
D. L. Windt, W. C. Cash and S. M. Kahn Ap. J., 528, 306-309 (2000)
Growth and structure of metallic barrier layer and interconnect films I: experiments
D. L. Windt, J. Dalla Torre, G. H. Gilmer, J. Sapjeta, R. Kalyanaraman, F. H. Baumann, P. L. O'Sullivan, D. Dunn, R. Hull Proc. MRS, 564, 307-312 (1999)
Growth and structure of metallic barrier layer and interconnect films II: atomistic simulations of film deposition onto inclined surfaces
J. Dalla Torre, G. H. Gilmer, D. L. Windt, F. H. Baumann, R. Kalyanaraman, Hanchen Huang, T. Diaz de la Rubia, and M. Djafari Rouhani Proc. MRS, 562, 129 (1999)
Low-stress W/Cr films for SCALPEL mask scattering layers
D. L. Windt, J. Vac. Sci. Technol. B, 17, 1385-1389 (1999)
Amorphous carbon films for use as both variable-transmission apertures and attenuated phase-shift masks for DUV lithography
D. L. Windt and R. A. Cirelli, J. Vac. Sci. Technol. B, 17, 930-932 (1999)
Multilayer films for figured X-ray optics
D. L. Windt, Proc. SPIE 3448 (1998)
IMD: Software for modeling the optical properties of multilayer films
D. L. Windt, Computers in Physics, 12, 360-370 (1998)
Variation in stress with background pressure in sputtered Mo/Si multilayer films
D. L. Windt, W. L. Brown, C. A. Volkert, and W. K. Waskiewicz, J. Appl. Phys., 78 2423-2430 (1995)
Multilayer facilities required for extreme-ultraviolet lithography
D. L. Windt and W. K. Waskiewicz, J. Vac. Sci. Technol. B, 12, 3826-3832 (1994)
Surface finish requirements for soft x-ray mirrors
D. L. Windt, W. K. Waskiewicz, and J. E. Griffith, App. Op., 33, 2025-2031 (1994)